OBIRCH 搜尋引擎推薦回答
OBIRCH - NanoPhysics B.V.
Optical Beam Induced Resistance Change (OBIRCH) is a very powerfull fault localization technique for your Integrated Circuit.
Optical beam induced resistance change (OBIRCH) - IEEE Xplore
Abstract: The OBIRCH is an indispensable failure analysis tool in the semiconductor industry. It is useful not only for test structures but also for final ...